Scanning Electron & Ion Microscopes (SEM)

Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and get images with information about the samples’ topography and composition.
CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.

        • High resolution surface sensitive information and materials contrast.
        • Widely used in nanotechnology, materials research, life sciences, semiconductor, raw materials and industry.


Modular SEM Platform for Intuitive Operation, Routine Investigations and Research Applications

The instruments of the EVO family combine high performance scanning electron microscopy with an intuitive, user-friendly experience that appeals to both trained microscopists and new users. With its comprehensive range of available options, EVO can be tailored precisely to your requirements, whether you are in life sciences, material sciences, or routine industrial quality assurance and failure analysis.

      • Versatile solution for central microscopy facilities or industrial quality assurance laboratories
      • Different chamber sizes and stage options that meet all application requirements – even for large industrial parts and samples
      • Maximum image quality with the Lanthanum Hexaboride (LaB6) emitter
      • Imaging and analytical excellence on non-conductive and uncoated samples
      • Multiple analytical detectors for demanding microanalysis applications

SmartSEM Touch

Class-Leading Usability

SmartSEM Touch puts interactive workflow control directly at your fingertips. It is quick and easy to learn, dramatically reducing training effort and costs. Within minutes, even new users will begin capturing stunning images. This user interface also supports industrial operators who require automated workflows for repeatable inspection tasks.

Excellent Image Quality

EVO excels at extracting the maximum data quality from uncoated and unaltered samples. EVO also safeguards data quality on hydrated and heavily contaminated samples, by allowing these samples to remain in their native state. Additionally, the LaB6 emitter will give that extra bit of resolution, contrast and signal-to-noise that is important when imaging and microanalysis get challenging. maximum data quality

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